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        5. Micrómetro digital de ultra alta velocidad y alta precisión

        Micrómetro digital de ultra alta velocidad y alta precisión

        Serie LS-9000

        2-Axis Optical Micrometer

        The 2-Axis optical micrometer

        The sensor without any moving parts achieves high durability and low maintenance

        The design includes no moving parts and an LED light source rendering constant calibration due to motor wear and laser degradation unnecessary. The rugged structure and built in air purge units provide stable measurement and inspection for extended periods of time.

        Advantage over conventional systems

        Advantage over conventional systems

        The LS-9000 series achieves a structure without any moving parts by removing the polygon mirror and motor, which are subject to severe wear during normal operation. This significantly reduces system cost of ownership.

        Environmental resistance

        Environmental resistance

        Equipped with the IP67 rated enclosure and the air purge unit as standard, the LS-9000 Series ensures safe, long-term use in varied environments.

        Outer diameter, center position, lump & neck down detection can be provided with a single system

        With the fastest in class high-speed sampling rate of 16,000 Hz, measurement delay function, and calculation function make it possible for the LS-9000 to perform outer diameter measurement, lump detection, and neck down detection with a single system reducing both inital installation costs and operating costs compared to traditional methods where each inspection required a dedicated system.

        Detection algorithm

        Detection algorithm

        The LS-9006D/LS-9030D calculates and displays the difference in measured values between two data points on the moving target: data point 1 that is currently being measured and data point 2 that was previously measured.(*Delay function + OUT calculation function)
        The small gradual variations in outer diameter can be ignored to detect emergent surface defects only.
        [Emergent surface defects = Data point 1 – Data point 2]

        Lump and Neck Down detection algorithm

        Lump and Neck Down detection algorithm

        Many times the outer diameter can grow or shrink over time making Lump and Neck Down detection difficult. The LS-9000 Series eliminates this problem by filtering out gradual changes in measurement while measuring the defects.

        Typical applications

        Measurement of the outer diameter of fine wire

        Measurement of the outer diameter of fine wire

        The average outer diameter and center position of wire can be measured with a high accuracy of ±0.5 μm 0.02 Mil.

        Outer diameter lump and neck down detection at ultra high speed

        Outer diameter lump and neck down detection at ultra high speed

        With the fastest sampling rate in its class of 16000 samples/sec., this micrometer can simultaneously perform both outer diameter measurement and lump and neck down detection at a pitch of around 1 mm 0.04"on a target traveling down the line at a speed of 1000 m/min. 3280.8'/min.

        Outer diameter measurement in harsh environments

        Outer diameter measurement in harsh environments

        With the new revolutionary measurement principle and standard air purge units, accurate measurements are possible in harsh environments.

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